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研究職(応用研究員)の求人923件応募資格・募集要項・仕事内容を見る
Principal / Senior / Engineer, DRAM Reliability
- 給与
- 記載なし
- 勤務地
- 記載なし
- 休日
- 記載なし
- 雇用形態
- 記載なし
どんな仕事かAIによる生成
Develops and implements test methodologies to evaluate wafer-level and circuit-level reliability behavior and performance. Analyzes results and integrates data to provide actionable recommendations for technology development, collaborating with Process Integration, characterization, and circuit design teams.
この求人に応募
応募資格
必須
- Understanding semiconductor device physics.
- Basic knowledge of DRAM or NAND or Emerging Memory.
- Knowledge of statistical data analysis.
- Outstanding communication skills.
- Basic knowledge of circuit operation.
- Candidates with least 3 year or more industry or research institute experience of semiconductor devices.
- Semiconductor device parametric measurement skills and experience in the operation of semiconductor lab instrumentation used for electrical characterization (Parameter Analyzers, Pulse Generators, Capacitance Meters, Wafer Probers, other tools).
- Understanding semiconductor device process technology.
- Knowledge of programming languages.
- Knowledge of semiconductor device structure and process for each generation.
- Understanding of circuit operation and DRAM product architecture.
- Knowledge of electrical analysis.
- M.S. or Ph.D. in Electrical Engineering, Physics, Materials Science, or related field with at least 2 years of experience.
募集要項最終確認 10/21
- 職種
- 研究職(応用研究員)
- 雇用形態
- 記載なし
- 役職
- PrincipalSenior
- 給与
- 記載なし
- 勤務地
- 記載なし
- 働き方
- 記載なし
- 経験年数
- 2年以上
- 学歴
- 大学院修了以上
- 掲載日
- 2026/10/12 05:18(10日前)
- 最終確認
- 2026/10/21 22:16(1日前)
仕事内容
募集内容
- Develop and implement test methodologies to evaluate wafer-level & circuit-level reliability behavior and performance.
- Analyze results and create reports to deliver decision-ready, actionable recommendations for guiding technology development.
- Collaborate with Process Integration and characterization teams to correlate reliability signature with process conversions and parametric test data.
- Integrate other data sources (inline metro, param, probe) and PFA analysis if need to model physical understanding and decision quality.
- Reliability model building and consultation from process integration team and circuit design team
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